Capacity limits and matching properties of lateral flux integrated capacitors - Custom Integrated Circuits, 2001, IEEE Conference on

15-7 Capacity Limits and Matching Properties of Lateral Flux Integrated Capacitors

Theoretical limits for the capacitance density of lateral flux and quasi-fractal capacitors are calculated. These limits are used to investigate the efficiency of various capacitive structures such as lateral flux and quasi-fractal structures. This study leads to two new capacitor structures with high lateralfield efficiency. Simulation and experimental results demonstrate higher capacity and s...

Capacity Limits and Matching Properties of Integrated Capacitors

Theoretical limits for the capacitance density of integrated capacitors with combined lateral and vertical field components are derived. These limits are used to investigate the efficiency of various capacitive structures such as lateral flux and quasifractal capacitors. This study leads to two new capacitor structures with high lateral-field efficiencies. These new capacitors demonstrate large...

Introduction to the Special Issue on the IEEE 2014 Custom Integrated Circuits Conference

Introduction to the Special Issue on the IEEE 2012 Custom Integrated Circuits Conference

2012 IEEE Custom Integrated Circuits Conference (CICC 2012) : San Jose, California, USA, 9 - 12 September 2012